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Issue Date Title Author(s) Journal View
2021-02
Influence of post-annealing on structural, optical and electrical properties of tin nitride thin films prepared by atomic layer deposition

Ansari, M.Z. ;  Janicek, P. ;  Nandi, D.K. ;  Palka, K. ;  Slang, S. ;  Kim, D.H. ;  Cheon, T. ;  Kim, S.-H.

Applied Surface Science, v.538, pp.147920, 2021-02

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